TY - JOUR T1 - PestNet : an end-to-end deep learning approach for large-scale multi-class pest detection and classification JO - IEEE Access UR - http://eprints.whiterose.ac.uk/150790/ PY - 2019/04/10 AU - Liu L AU - Wang R AU - Xie C AU - Yang P AU - Wang F AU - Sudirman S AU - Liu W ED - DO - DOI: 10.1109/access.2019.2909522 PB - Institute of Electrical and Electronics Engineers (IEEE) VL - 7 SP - 45301 EP - 45312 Y2 - 2025/05/26 ER -